ICT Contact Probes
During in-circuit testing (ICT), each component of an electronic assembly is checked for faults. Short circuits, interruptions, soldering or component faults are detected and assemblies are rejected according to a go/no-go test.
While ICT (in-circuit test) contact probes are used to test components, FCT (functional test) contact probes can be used to test entire assemblies.
FCT Contact Probes
During functional testing (FCT), the assemblies are tested completely or in partial areas for the intended operation. The function test of the modules is carried out in the end application or in an environment that simulates the end application.
Advantages you benefit from
- Increased first pass yield (FPY)
- Longer life cycle
- Low contact resistance
- Constant (low) contact resistance over life time
- Reduced maintenance time and costs
- Easy mounting and replacement with suitable tools
