Pointes de test ICT/FCT - F051 Pointe de test Feinmetall 50 mm Version longue course
Pointes de test ICT/FCT - F051 Pointe de test Feinmetall 50 mm Version longue course

Applications of ICT / FCT Contact Probes – Feinmetall

FEINMETALL is your partner for the reliable contacting of electronic components. The wide range of applications for spring contact probes includes board tests with fine centers up to wire harness and connector tests with individual and intelligent solutions.

Assembled and Bare Printed Circuit Boards
Test equipment for assembled standard PCBs, multilayer and other special PCBs as well as unassembled PCBs (bare board).

Standard Contacting of Pins, Pads and Vias
Test equipment for all types of devices under test (DUT) such as component pins, solder pads, vias and others.

Single and Dual Stage Contacting
Range of different lengths of test equipment for single and dual stage contacting as well as for compensating other height differences.

Depending on the test item, the application and the operation conditions, Feinmetall provides the optimal solution

  • International standard contact probes
  • Metric contact probes
  • Progressive Series for difficult conditions
  • Flying probes
  • Bead probes
  • Bare board probes
  • Fine pitch probes

Special Head Made of Silver Alloy

In high current applications ideally no voltage should apply and accordingly no current should flow during closing or releasing the contact. Otherwise, an electric spark may occur, which may damage the surface of the contact area. To avoid or at least minimize such a contact burn-off, FEINMETALL offers tips made of a special silver alloy to minimize the contact burn-off, reducing the transition resistance and lead to a longer life time of the probes.